Next-gen 4D-STEM and quantitative imaging with Timepix4

Join us for a three-part webinar series exploring the Merlin T4 from Quantum Detectors, the first hybrid pixel detector to combine frame-based and event-based imaging in a single system. From capturing elusive skyrmions to enabling ultrafast 4D-STEM and ptychography, this series showcases how hybrid detection is set to transform the future of transmission electron microscopy (TEM).

• Part 1: How to capture skyrmions and beam sensitive materials with precision | Date: August 19 at 16:00 BST / 17:00 CEST / 11:00 EDT / 08:00 PDT
• Part 2: Next-gen 4D-STEM and quantitative imaging with Timepix4 | Date: August 27 at 16:00 BST / 17:00 CEST / 11:00 EDT / 08:00 PDT
• Part 3: Advanced materials imaging and time-resolved analysis using hybrid pixel detectors | Date: September 5 at 16:00 BST / 17:00 CEST / 11:00 EDT / 08:00 PDT

August 27, 2025 at 16:00 BST / 17:00 CEST / 11:00 EDT / 08:00 PDT

As dimensionality in transmission electron microscopy (TEM) expands, next-generation ultrafast detectors are making it possible to record 4D data sets at acquisition speeds comparable to traditional bright- and dark-field techniques. These advancements are paving the way for versatility in scanning TEM (STEM) and the ability to quantify charge densities with subatomic resolution, to measure polarisation-induced electric fields, and to solve the phase problem by ptychographic techniques.

Join Professor Knut Müller-Caspary, LMU Munich & Ernst-Ruska Centre and Matt Callahan, Quantum Detectors, as they hold an in-depth discussion showcasing the technologies that can transform 4D-STEM workflows to enable new levels of precision in electric field mapping, charge density analysis, and ptychographic phase retrieval. Plus, learn how you can combine real-space and reciprocal-space imaging in a single scan, and see first-hand results from pioneering applications.

Key learning objectives:

• Understand how Timepix4-based detectors enable high-speed, event-driven 4D-STEM acquisition for advanced electron microscopy workflows
• Explore real-world application data from Merlin T4 deployments, including results from beam-sensitive and thick specimens
• Gain insights into integrating next-generation detectors into existing TEM setups, including software compatibility and data processing strategies

Who should attend?

• TEM users and electron microscopy researchers in materials science, semiconductors, and nanotechnology looking to advance spatial and temporal resolution through techniques like electron diffraction and 4D-STEM.
• Facility managers and imaging leads exploring next-generation detector upgrades and workflow integration.
• Data scientists and software developers working on reconstruction algorithms, ptychography, or real-time data processing in microscopy.

Certificate of attendance
If you attend the live webinar, you will automatically receive a certificate of attendance, including a learning outcomes summary, for continuing education purposes.

If you view the on-demand webinar, you can request a certificate of attendance by emailing editor@selectscience.net.