Next-gen 4D-STEM and quantitative imaging with Timepix4
Hybrid pixel imaging: Bridging frame-based and event-based detection
A three-part webinar series
Join us for a three-part webinar series exploring the Merlin T4 from Quantum Detectors, the first hybrid pixel detector to combine frame-based and event-based imaging in a single system. From capturing elusive skyrmions to enabling ultrafast 4D-STEM and ptychography, this series showcases how hybrid detection is set to transform the future of transmission electron microscopy (TEM).
- Part 1: How to capture skyrmions and beam sensitive materials with precision | Date: August 19 at 16:00 BST / 17:00 CEST / 11:00 EDT / 08:00 PDT
- Part 2: Next-gen 4D-STEM and quantitative imaging with Timepix4 | Date: August 27 at 16:00 BST / 17:00 CEST / 11:00 EDT / 08:00 PDT
- Part 3: Probing beam sensitive materials while preserving sample integrity with 4D-STEM and EELS | Date: September 22 at 13:00 BST / 14:00 CEST / 08:00 EDT / 05:00 PDT
August 27, 2025 at 16:00 BST / 17:00 CEST / 11:00 EDT / 08:00 PDT
As dimensionality in transmission electron microscopy (TEM) expands, next-generation ultrafast detectors are making it possible to record 4D data sets at acquisition speeds comparable to traditional bright- and dark-field techniques. These advancements are paving the way for versatility in scanning TEM (STEM) and the ability to quantify charge densities with subatomic resolution, to measure polarisation-induced electric fields, and to solve the phase problem by ptychographic techniques.
Join Professor Knut Müller-Caspary, LMU Munich & Ernst-Ruska Centre and Matt Callahan, Quantum Detectors, as they hold an in-depth discussion showcasing the technologies that can transform 4D-STEM workflows to enable new levels of precision in electric field mapping, charge density analysis, and ptychographic phase retrieval. Plus, learn how you can combine real-space and reciprocal-space imaging in a single scan, and see first-hand results from pioneering applications.
Who should attend?
- TEM users and electron microscopy researchers in materials science, semiconductors, and nanotechnology looking to advance spatial and temporal resolution through techniques like electron diffraction and 4D-STEM.
- Facility managers and imaging leads exploring next-generation detector upgrades and workflow integration.
- Data scientists and software developers working on reconstruction algorithms, ptychography, or real-time data processing in microscopy.
Certificate of attendance
If you attend the live webinar, you will automatically receive a certificate of attendance, including a learning outcomes summary, for continuing education purposes.
If you view the on-demand webinar, you can request a certificate of attendance by emailing editor@selectscience.net.
Webinar details
- Cost: Free to attend
- Location: Online
- Duration: 60 minutes
Registration is required to secure your place. If you register but can’t attend live, you will receive a link to the on‑demand recording once it becomes available.
Speakers
What will this webinar cover?
- Understand how Timepix4-based detectors enable high-speed, event-driven 4D-STEM acquisition for advanced electron microscopy workflows
- Explore real-world application data from Merlin T4 deployments, including results from beam-sensitive and thick specimens
- Gain insights into integrating next-generation detectors into existing TEM setups, including software compatibility and data processing strategies
Join the webinar to get answers to these questions:
- How do Timepix4-based detectors enable high-speed, event-driven 4D-STEM acquisition?
- What performance gains does the Merlin T4 deliver for beam-sensitive and thick specimens?
- How can hybrid pixel detectors improve electric field mapping and charge density analysis?
- What are best practices for integrating Merlin T4 into existing TEM workflows and software?
- How can data processing strategies optimize ptychographic phase retrieval and 4D-STEM datasets?