How to capture skyrmions and beam sensitive materials with precision

Join us for a three-part webinar series exploring the Merlin T4 from Quantum Detectors, the first hybrid pixel detector to combine frame-based and event-based imaging in a single system. From capturing elusive skyrmions to enabling ultrafast 4D-STEM and ptychography, this series showcases how hybrid detection is set to transform the future of transmission electron microscopy (TEM).

• Part 1: How to capture skyrmions and beam sensitive materials with precision | Date: August 19 at 16:00 BST / 17:00 CEST / 11:00 EDT / 08:00 PDT
• Part 2: Next-gen 4D-STEM and quantitative imaging with Timepix4 | Date: August 27 at 16:00 BST / 17:00 CEST / 11:00 EDT / 08:00 PDT
• Part 3: Advanced materials imaging and time-resolved analysis using hybrid pixel detectors | Date: September 5 at 16:00 BST / 17:00 CEST / 11:00 EDT / 08:00 PDT

Part 1 – August 19, 2025 at 16:00 BST / 17:00 CEST / 11:00 EDT / 08:00 PDT

From capturing the intricate dynamics of FeGe skyrmions to imaging beam-sensitive materials like strontium titanate with minimal damage, the Merlin T4 is already redefining what is possible in transmission electron microscopy. As the first hybrid pixel detector to combine frame-based and event-based imaging in a single system, it is enabling researchers to explore 4D-STEM, ultrafast in situ studies, and high-resolution structural analysis with a level of speed and precision previously out of reach.

Join us for this exclusive webinar with Dr. Matúš Krajňák, Application Scientist, Quantum Detectors, as he discusses how the Merlin T4 supports a wide range of applications in materials science and semiconductor research and was featured in recent academic publications.

Key learning objectives:

• Understand the difference between event-based and frame-based detection and when to use each.
• Discover how the Merlin T4 supports ultrafast, high-resolution electron microscopy workflows.
• Explore real-world use cases and scientific datasets enabled by the detector.
• Evaluate the Merlin T4’s positioning as a universal detector for materials science and semiconductor applications.

Who should attend?

• Researchers and professionals using transmission electron microscopy, including 4D-STEM and ultrafast TEM.
• Materials scientists, semiconductor R&D specialists, and lab managers assessing advanced detector technologies.

Certificate of attendance
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If you view the on-demand webinar, you can request a certificate of attendance by emailing editor@selectscience.net.