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The drying of biological specimens such as pollen, tissue, plants, insects, as well as industrial samples, for example MEMS (Micro Electro Mechanical Systems) for SEM analysis can be prepared in the Leica EM CPD300 Critical Point Dryer, fu... Read more...
The Ultramicrotome Leica EM UC7 provides easy preparation of semi- and ultrathin sections as well as perfect, smooth surfaces of biological and industrial samples for TEM, SEM, AFM and LM examination. New Standard in Ultramicrotomy Co... Read more...
Perfect Glass Knives for perfect ultrathin sections for EM and LM applications The balanced break method of the Leica EM KMR3 ensures perfect glass knives in three thicknesses 6,4 mm, 8 mm and 10 mm. Ease of Use The Leica EM KMR3 is... Read more...
The innovative Leica EM TP is the first tissue processor designed for EM and LM resin processing, that features a heating/cooling system with pre-heat and pre-cool capabilities to maintain a constant processing temperature. It includes a... Read more...
sciTEM - sample preparation for electron microscopy Read more...
Sample surfaces are inevitably coated with hydrocarbon contamination due to sample preparation or from storage. The ZONE desktop sample cleaner/desiccator gently removes contaminations to reveal the true surface of your specimens. The... Read more...
For one of the most common glow discharge applications, making TEM support films or grids hydrophilic using air, the PELCO easiGlow™ uses an automated and quick cycle with fully selectable parameters. The microprocessor controlled system a... Read more...
For optimal imaging and microanalysis in electron microscopy, it is imperative to have a clean, well-prepared specimen. This is especially true for many modern electron microscopes, which employ high brightness electron sources, such as La... Read more...
108 Auto Sputter Coater - ideal for routine sample preparation for scanning electron microscopy The Ted Pella 108 Auto Sputter Coater is ideally suited for automated high quality coating of non-conducting samples for standard SEM imagi... Read more...