Introducing the Park NX-Tip Scan Head
5 Aug 2020This video by Park Systems introduces the Park NX-Tip Scan Head, the automated Atomic Force Microscope (AFM) System for ultra large and heavy flat panel displays at nanoscale for OLED, LCD, and photonics applications.
About the company
Park Systems
Park Systems is a global leader in nanoscale microscopy and metrology solutions, dedicated to empowering scientists, engineers, and industries to push the boundaries of innovation. Built on a pioneering legacy in atomic force microscopy (AFM), the company has grown into the world’s #1 AFM provider and now offers a diversified portfolio that includes imaging spectroscopic ellipsometry (ISE), nanoscale IR spectrometers (AFM-IR), white light interferometry (WLI), active vibration isolation (AVI), and digital holographic microscopy (DHM).
With headquarters in Korea, 16 global offices, and a trusted customer base of leading universities, national labs, and semiconductor fabs, Park Systems is shaping—and expanding—the future of nanometrology.
