SelectScience InterviewsMaterials
Automated SEM workflows driving faster, cleaner and more consistent analysis
24 Apr 2026
Automated scanning electron microscopy (SEM) workflows offer a powerful way to accelerate and standardize complex imaging and analysis tasks, reducing repetitive manual steps while strengthening QC imaging, particle and material measurement, and technical cleanliness assessments. Discover how Electron Microscope Flow Creator (EMFlow) supports these advances as Dr. Thomas Schmidt of Hitachi High‑Tech Europe demonstrates its impact on standardization, accuracy, and overall operational efficiency across demanding SEM applications.
This video was filmed at analytica 2026.