Electron Microscopy Products & Reviews

Based on Thermo Scientific™ Titan S/TEM platform – introduced in 2005 – the Themis TEM family forms the next generation of some of the world's most powerful, commercially available suite of S/TEM solutions for Materials Science, with Themis Z and Themis ETEM.

in situ Transmission Electron Microscope

Automatic single- or twin-wheel grinding and polishing machine with single or central pressure, for working wheels Ø 200/250/300 mm. High-performance PLUS head allows use of large sample holders up to Ø 185 mm (central pressure). Make it easy. Make it automated.

Next generation sample preparation for cryo-EM 

Your Interactive SEM for Multi-User Environments

Large area imaging for SEM, FE-SEM & FIB-SEM ATLAS combines a 16 bit scan generator and dual super-sampling signal acquisition hardware with image processing and control software for your ZEISS electron microscope. Acquire images up to 32 k x 32 k pixels, with dwell times from 100 ns to > 100 s, adjustable in 100 ns increments. Save your images with eight or sixteen bits of intensity. With the ATLAS “Mosaic Tool” you create la…

ZEISS Electron Microscopy Application Software for TEM With ZEMAS software you easily acquire and analyse data with ZEISS LIBRA series transmission electron microscopes. Profit from an experiment driven workflow interface including the complete system integration of all TEM components. Data handling, processing and archiving is built on a database architecture providing a solid base for multi-user, high-throughput instrument u…

The World's Fastest Scanning Electron Microscopes.

The World’s Fastest Scanning Electron Microscopes  

High-Resolution Schottky VP FE-SEM

DII-29020HD (HD Treatment)

JEM-3300 CRYO ARM300 II

JII-29080DMS (Sample Holder Pre-exhaust System)

JSM-IT210

JSM-IT810 Series

JSM-IT710

High-performance Ar+ ion polisher

JED-2300T Energy Dispersive X-ray Spectrometer (Large Angle SDD-EDS)

JSM-IT510

FIB-SEM optimised for large-volume 3D examinations

The fully digital TEM / STEM for all applications, available in 3 models

Merlin T4 is a cutting-edge hybrid pixel detector engineered for ultrafast applications in STEMs. Ideal for 4D-STEM, ultrafast diffraction, and ultrafast TEM imaging of dynamic processes from all types of samples, including beam-sensitive materials.

The ORCA-Fusion, built from the sensor up, balances the complex nuances of camera features to provide beautiful images and robust data at all lights levels, but especially in tough low-light conditions.

JBX-A9 Electron Beam Lithography System

SightSKY