ZEISS SIGMA VP by ZEISS Research Microscopy Solutions

5.0
/
5.0
  |  2 reviews
Field Emission-SEM for advanced analytical microscopyThe SIGMA series of Field Emission Scanning Electron Microscopes (FE-SEM) delivers advanced analytical microscopy with the high performance you expect from Carl Zeiss. Equipped with the GEMINI column with its in-lens secondary electron detection, the SIGMA series brings you analytical performance, integrated workflows and increased productivity. For the imaging of non-conducting samples, variable pressure modes of operation are available with ... Read more


ZEISS SIGMA VP by ZEISS Research Microscopy Solutions product image
ZEISS SIGMA VP
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Average Rating: 5.0
2 Scientists have reviewed this product

5 out of 5
Ease of use
5 out of 5
After sales service
5 out of 5
Value for money


  • Status:

    Reviewer
  • Member since: 2007

  • Organization: IIT



  • Ease of use
    5 out of 5
    After sales service
    5 out of 5
    Value for money
    5 out of 5
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This is a great tool for high quality research in nanotechnology & materials science.
Rating: 5.0

  • Application Area: Materials science, nanotechnology, semiconductor

"This model is very easy to use and provides a stable analytical platform, with extra high resolution imaging with the in-lens detector, that allows users to refine the beam. The VP feature allows a wide range of samples to be viewed with minimum sample preparation. Just mount the sample and view the image in a few minutes. Image navigation allows users to navigate samples easily at the click of the mouse, a must have time saving feature. The integrated keyboard is also very useful in this machine. We are highly impressed with the performance of this equipment."

Review date: 22 May 2020 | ZEISS SIGMA VP
  • Status:

    Reviewer

  • Member since: 2012

  • Organization: University Of Glasgow



  • Ease of use
    5 out of 5
    After sales service
    5 out of 5
    Value for money
    5 out of 5
Share this ReviewShare this Review on TwitterShare this Review
Rating: 5.0

  • Application Area:Materials analysis

"The Sigma is easy to use and provides a stable analytical platform, with extra high resolution imaging with the in-lens detector, that allows users to refine the beam. The VP feature allows a wide range of sample to be viewed with minimum sample prep. Just mount and view. Image navigation allows users to navigate samples easily with the click of the mouse, a must have time saving feature. The integrated keyboard is also a must have."

Review date: 13 Nov 2012 | ZEISS SIGMA VP
Field Emission-SEM for advanced analytical microscopy

The SIGMA series of Field Emission Scanning Electron Microscopes (FE-SEM) delivers advanced analytical microscopy with the high performance you expect from Carl Zeiss. Equipped with the GEMINI column with its in-lens secondary electron detection, the SIGMA series brings you analytical performance, integrated workflows and increased productivity.

For the imaging of non-conducting samples, variable pressure modes of operation are available with SIGMA VP. It is compatible with a wealth of accessories including the class leading BSD an VPSE G3 detectors for superior materials contrast and SE imaging in VP.