ZEISS ORION NanoFab SIMS by ZEISS Research Microscopy Solutions

Leverage the SIMS detector and carry out elemental analysis with <15 nm lateral resolution, the highest SIMS resolution available. Correlate with high-resolution secondary electron images or perform patterning. Benefit from multi-modal characterization: investigate your specimen with different modalities, like light microscopy and correlate the results to comprehensively characterize your material.