ZEISS ORION NanoFab SIMS by ZEISS Research Microscopy Solutions

Leverage SIMS and Achieve the Highest Lateral Resolution.


ZEISS ORION NanoFab SIMS by ZEISS Research Microscopy Solutions product image
ZEISS ORION NanoFab SIMS
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Leverage the SIMS detector and carry out elemental analysis with <15 nm lateral resolution, the highest SIMS resolution available. Correlate with high-resolution secondary electron images or perform patterning. Benefit from multi-modal characterization: investigate your specimen with different modalities, like light microscopy and correlate the results to comprehensively characterize your material.