Park NX20 by Park Systems

Manufacturer Park Systems  |  Available Worldwide
Atomic Force Microscope for failure analysis and large sample research


Park NX20 by Park Systems product image
Park NX20
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Park NX20 is a large sample AFM solution for Failure Analysis and Research Laboratories with unique features such as accurate and reproducible measurements with decoupled XY scanning system, surface roughness measurements with Low Noise Z Detector, True Non-Contact™ Mode ensuring tip sharpness for surface roughness accuracy, wide range of high resolution scanning modes and modular design. NX20 is widely used the semiconductor and hard disk industry for its data accuracy and reproducible measurements improving productivity standards.

Key Technical Features:

  • 2D Flexure-Guided Scanner with 100 µm x 100 µm Scan Range
  • High Speed Z Scanner with 15 µm Scan Rang
  • Low Noise XYZ Position Sensor
  • Motorized XY Sample Stage with Optional Encoders
  • Step-and-Scan Automation
  • Accessible Sample Holder
  • Expansion Slot for Advanced SPM Modes and Options
  • Direct On-Axis High Powered Optics with Integrated LED Illumination
  • Auto Engage by Slide-to-Connect SLD Head
  • Vertically Aligned Motorized Z Stage and Focus Stage
  • High Speed 24-bit Digital Electronics