ZEISS LSM 900, the confocal laser scanning microscope (CLSM) from ZEISS, is the ideal instrument for materials analysis. Characterize 3D microstructures surfaces topography in your lab or multi-user facility. LSM 900 enables precise, three-dimensional imaging and analyses of nanomaterials, metals, polymers, and semiconductors. Extend your upright light microscope, ZEISS Axio Imager.Z2m or your inverted light microscope ZEISS Axio Observer 7, with a confocal scanning module. Combine all essential light microscopy contrasting techniques for materials with high precision topography. With no need to change microscopes, you’ll save time on set-up. Benefit from automated data acquisition and post-processing. Execute non-contact confocal imaging when evaluating surface roughness.