Leica DCM8 3D Optical Surface Metrology System by Leica Microsystems EMEA

Get the Full Picture!

Designed to help you maximize efficiency, the Leica DCM8 unites the advantages of High Definition confocal microscopy with interferometry into one versatile, dual-core system. Ultra-fast analysis is ensured thanks to one-click mode selection, sophisticated software and HD confocal scanning without moving parts.

Whether you are working in production or research, the Leica DCM8 delivers the accurate, repeatable metrological analysis results you need in order to optimize material performance.

Does your surface have steep slopes or complex shapes? Achieve vertical resolution up to 2 nm with HD confocal microscopy. Is your surface smooth with micro peaks and valleys? Choose from three interferometry modes: Vertical Scanning Interferometry (VSI), Phase Shift Interferometry(PSI) or extended PSI (ePSI) for resolution of up to 0.1 nm.

And, if you need a quick, brilliant HD 2D image, the Leica DCM8 offers brightfield and darkfield modes.