Sequential X-ray fluorescence spectrometer
Lab Center XRF-1800
Average Rating: 5.0
1 Scientist has reviewed this product
Status:
Reviewer
Member since: 2020
Organization: Inyahbi México
-
- Ease of use
- After sales service
- Value for money
XRF non destructive mapping and thichness analysis of coating layers
Rating: 5.0
Application Area: Thickness coating
"Excellent equipment for element analysis as it's a great precision tool machine. It features a special application to analyze and map chemical element composition and thickness up to three coating layers in solid bulk samples. A very accurate estandar method for RoHS, Wee or ELV analysis is included in this software and library."
Review date: 17 Oct 2021 | Lab Center XRF-1800
Sample of mapping
World first 250µm mapping for wavelength dispersive analysis. This enables to analyze content distribution and intensity distribution of non uniform sample.
High-order x-ray peak decision
System can switch first-order profile to high-order profile display. User can do more accurate evaluation of higher-order peak interference.
Film thickness measurement with the background FP method
System can calculate theoretical scattering x-ray intensity by original background-FP method. Inorganic component or polymer thickness can be estimated by this calculation method.
Product Overview
