Lab Center XRF-1800 by Shimadzu Scientific

Manufacturer Shimadzu Scientific
5.0
/
5.0
  |  1 reviews
Sequential X-ray fluorescence spectrometer


Lab Center XRF-1800 by Shimadzu Scientific product image
Lab Center XRF-1800
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Average Rating: 5.0
1 Scientist has reviewed this product

5 out of 5
Ease of use
5 out of 5
After sales service
5 out of 5
Value for money


  • Status:

    Reviewer
  • Member since: 2020

  • Organization: Inyahbi México



  • Ease of use
    5 out of 5
    After sales service
    5 out of 5
    Value for money
    5 out of 5
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XRF non destructive mapping and thichness analysis of coating layers
Rating: 5.0

  • Application Area: Thickness coating

"Excellent equipment for element analysis as it's a great precision tool machine. It features a special application to analyze and map chemical element composition and thickness up to three coating layers in solid bulk samples. A very accurate estandar method for RoHS, Wee or ELV analysis is included in this software and library."

Review date: 17 Oct 2021 | Lab Center XRF-1800

Sample of mapping

World first 250µm mapping for wavelength dispersive analysis. This enables to analyze content distribution and intensity distribution of non uniform sample.

High-order x-ray peak decision

System can switch first-order profile to high-order profile display. User can do more accurate evaluation of higher-order peak interference.

Film thickness measurement with the background FP method

System can calculate theoretical scattering x-ray intensity by original background-FP method. Inorganic component or polymer thickness can be estimated by this calculation method.

Product Overview

Lab Center XRF-1800 by Shimadzu Scientific product image

Lab Center XRF-1800

Manufacturer Shimadzu Scientific

5.0 / 5.0 | 1 reviews