Member since: 2020
Organization: Inyahbi México
XRF non destructive mapping and thichness analysis of coating layers
Application Area: Thickness coating
"Excellent equipment for element analysis as it's a great precision tool machine. It features a special application to analyze and map chemical element composition and thickness up to three coating layers in solid bulk samples. A very accurate estandar method for RoHS, Wee or ELV analysis is included in this software and library."
Sample of mapping
World first 250µm mapping for wavelength dispersive analysis. This enables to analyze content distribution and intensity distribution of non uniform sample.
High-order x-ray peak decision
System can switch first-order profile to high-order profile display. User can do more accurate evaluation of higher-order peak interference.
Film thickness measurement with the background FP method
System can calculate theoretical scattering x-ray intensity by original background-FP method. Inorganic component or polymer thickness can be estimated by this calculation method.