JXA-8530F by JEOL USA

Manufacturer JEOL USA  |  Available Worldwide
4.0
/
5.0
  |  1 reviews
Since the 1960s, JEOL EPMA systems have been the leading microprobes used in high accuracy qualitative and quantitative in-depth surface analysis as well as area analysis. JEOL EPMA systems have evolved to enhance the user experience with “Easy EPMA” software and integrated EDS analysis. See our newest EPMA systems


JXA-8530F by JEOL USA product image
JXA-8530F
Request Pricing

Receive your quote directly from the manufacturer.




Average Rating: 4.0
1 Scientist has reviewed this product

4 out of 5
Ease of use
4 out of 5
After sales service
4 out of 5
Value for money


  • Status:

    Reviewer
  • Member since: 2006

  • Organization: Strathclyde University



  • Ease of use
    4 out of 5
    After sales service
    4 out of 5
    Value for money
    4 out of 5
Share this Review on LinkedinShare this Review on TwitterShare this Review on Facebook
Very pleased with this instrument and the data it provides.
Rating: 4.0

  • Application Area: Microanalysis of semiconductors and other materials

"The electron probe delivers excellent X-ray microanalysis data and is robust and reliable. Customization for cathodoluminescence has added to the performance. The software is complex and frustrating at times, but that is hard to avoid for such a complex instrument that can be used in many different ways."

Review date: 30 Oct 2020 | JXA-8530F

Since the 1960s, JEOL EPMA systems have been the leading microprobes used in high accuracy qualitative and quantitative in-depth surface analysis as well as area analysis.

JEOL EPMA systems have evolved to enhance the user experience with “Easy EPMA” software and integrated EDS analysis. See our newest EPMA systems