Since the 1960s, JEOL EPMA systems have been the leading microprobes used in high accuracy qualitative and quantitative in-depth surface analysis as well as area analysis.
JEOL EPMA systems have evolved to enhance the user experience with “Easy EPMA” software and integrated EDS analysis. See our newest EPMA systems
JXA-8530F
Average Rating: 4.0
1 Scientist has reviewed this product
Status:
Reviewer
Member since: 2006
Organization: Strathclyde University
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- Ease of use
- After sales service
- Value for money
Very pleased with this instrument and the data it provides.
Rating: 4.0
Application Area: Microanalysis of semiconductors and other materials
"The electron probe delivers excellent X-ray microanalysis data and is robust and reliable. Customization for cathodoluminescence has added to the performance. The software is complex and frustrating at times, but that is hard to avoid for such a complex instrument that can be used in many different ways."
Review date: 30 Oct 2020 | JXA-8530F
Since the 1960s, JEOL EPMA systems have been the leading microprobes used in high accuracy qualitative and quantitative in-depth surface analysis as well as area analysis.
JEOL EPMA systems have evolved to enhance the user experience with “Easy EPMA” software and integrated EDS analysis. See our newest EPMA systems
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