Field Emission Scanning Electron Microscope
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JSM-IT800 series
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The JEOL IT800 series of Schottky Field Emission SEMs with integrated Energy Dispersive X-ray (EDS) is the most advanced analytical FE SEM technology available today. A choice of models (HL and SHL) allows for a wider variety of applications - Hybrid Lens and Super Hybrid Lens are based on a combination of the electrostatic and electromagnetic-field lens. With up to 2,000,000X magnification and an accelerating range of 0.01 to 30kV, the IT800SHL ultrahigh resolution SEM acquires stunning details of nanostructures and enables comprehensive analysis.
- High spatial resolution for imaging and EDS mapping
- BSE detectors (BED), a scintillator (SBED) and versatile (VBED) for increased sensitivity
- NeoEngine Automates and Optimizes Electron Beam Control
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