The JEOL IT800 series of Schottky Field Emission SEMs with integrated Energy Dispersive X-ray (EDS) is the most advanced analytical FE SEM technology available today. A choice of models (HL and SHL) allows for a wider variety of applications - Hybrid Lens and Super Hybrid Lens are based on a combination of the electrostatic and electromagnetic-field lens. With up to 2,000,000X magnification and an accelerating range of 0.01 to 30kV, the IT800SHL ultrahigh resolution SEM acquires stunning details of nanostructures and enables comprehensive analysis.