Manufacturer JEOL USA
Scanning Electron Microscope

JSM-IT500  by JEOL USA product image
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A versatile research grade SEM with Zero Mag software and Live Analysis. Both high vacuum and low vacuum models are available with or without embedded EDS system. This SEM features a large sample chamber with a stage that can cover samples as large as 178mm (d) by 80mm (h). The stage is mounted inside the chamber, enabling users to secure large, heavy and odd shaped objects on the stage with clear positioning prior to evacuating the chamber. Multiple ports are optimally positioned for analytical attachments such as: energy dispersive X-ray spectrometer (EDS), electron backscatter diffraction (EBSD), cathodoluminescence detectors (CL), wavelength dispersive X-ray spectrometer (WDS), chamberscopes, heating/cooling sub-stages, etc.

  • Large sample chamber
  • Zeromag simplifies navigation with seamless transition from an optical to SEM image
  • High throughput microanalysis with analytical models with full integration of EDS
  • High resolution with unsurpassed low kV performance
  • High vacuum to expanded pressure in low vacuum mode
  • Large specimen chamber with multiple ports
  • SmileView™ Lab for integrated management of image and analysis data