JSM-IT200 by JEOL USA

Manufacturer JEOL USA
Scanning Electron Microscope


JSM-IT200  by JEOL USA product image
JSM-IT200
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Compact, versatile Scanning Electron Microscope that provides great value with high throughput, high resolution imaging and unsurpassed low kV performance. Analytical models include "Live View" of EDS spectra in real time. Powerful software functionality, including automated image montaging, integrated management of image and analysis data, and automated report generation from all data ranging from collected SEM images to elemental analysis results.