JSM-IT200 by JEOL USA

Manufacturer JEOL USA
5.0
/
5.0
  |  1 reviews
Scanning Electron Microscope
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JSM-IT200  by JEOL USA product image
JSM-IT200

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Average Rating: 5.0
1 Scientist has reviewed this product

5 out of 5
Ease of use
5 out of 5
After sales service
5 out of 5
Value for money


  • Status:

    Reviewer
  • Member since: 2021

  • Organization: VNIT Nagpur



  • Ease of use
    5 out of 5
    After sales service
    5 out of 5
    Value for money
    5 out of 5
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Great results
Rating: 5.0

  • Application Area: Separation Technology

"Excellent applications"

Review date: 14 Sep 2022 | JSM-IT200
Compact, versatile Scanning Electron Microscope that provides great value with high throughput, high resolution imaging and unsurpassed low kV performance. Analytical models include "Live View" of EDS spectra in real time. Powerful software functionality, including automated image montaging, integrated management of image and analysis data, and automated report generation from all data ranging from collected SEM images to elemental analysis results.

Product Overview

JSM-IT200  by JEOL USA product image

JSM-IT200

Manufacturer JEOL USA

5.0 / 5.0 | 1 reviews