Member since: 2021
Good results, the micrographs have great quality.
Application Area: Morphology characterization and elemental analyses
"The instruments provide good images at micron and submicron ranges. It is really easy to use, either for teaching and research. The accuracy and reproducibility are really good the sample preparation is also a crucial factor. The after-sales care is good and efficient, however, it is expensive. "
Member since: 2021
Easy and convenient for routine study of morphology and elemental composition.
Application Area:Materials design and development for device applications
"The JEOL Field Emission Scanning Electron Microscope is one of the simplest and most convenient characterization facilities for materials study. It is being routinely used to get information on the microscopic morphology, surface elemental composition of organic, inorganic, polymers etc. The convenience of loading multiple samples has made it a routine characterization facility for several researchers. The possibility of studying the cross sections opens up a new field for research. The mapping facility gives information on the elemental distribution. It is a work horse with minimum maintenance."
Member since: 2020
Organization: King Saud University
Very good results.
"Very easy to use, user friendly. High resolution images. Highly advanced systems."
The JEOL JSM-7610FPlus Field Emission SEM combines two proven technologies – a semi-in-lens detector with integrated electron energy filter (r-filter) and an in-the-lens Schottky field emission gun – to deliver ultrahigh spatial resolution with a wide range of probe currents for all applications (1pA to more than 200 nA). The JSM-7610FPlus offers true 1,000,000X magnification with 0.8nm resolution at 15kV (1.0nm at 1kV) and unmatched beam stability, making it possible to observe the fine surface morphology of nanostructures.
Ultrahigh spatial resolution.