Status:
Reviewer
Member since: 2021
Organization: UAEM
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- Ease of use
- After sales service
- Value for money
Good results, the micrographs have great quality.
Application Area: Morphology characterization and elemental analyses
"The instruments provide good images at micron and submicron ranges. It is really easy to use, either for teaching and research. The accuracy and reproducibility are really good the sample preparation is also a crucial factor. The after-sales care is good and efficient, however, it is expensive. "
Review date: 07 Jun 2021 | JSM-7610FPlus
Status:
Reviewer Member since: 2021
Organization: CSIR-IICT
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- Ease of use
- After sales service
- Value for money
Easy and convenient for routine study of morphology and elemental composition.
Application Area:Materials design and development for device applications
"The JEOL Field Emission Scanning Electron Microscope is one of the simplest and most convenient characterization facilities for materials study. It is being routinely used to get information on the microscopic morphology, surface elemental composition of organic, inorganic, polymers etc. The convenience of loading multiple samples has made it a routine characterization facility for several researchers. The possibility of studying the cross sections opens up a new field for research. The mapping facility gives information on the elemental distribution. It is a work horse with minimum maintenance."
Review date: 14 May 2021 | JSM-7610FPlus
Status:
Reviewer Member since: 2020
Organization: King Saud University
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- Ease of use
- After sales service
- Value for money
Very good results.
Application Area:Characterization
"Very easy to use, user friendly. High resolution images. Highly advanced systems."
Review date: 24 Dec 2020 | JSM-7610FPlus
The JEOL JSM-7610FPlus Field Emission SEM combines two proven technologies – a semi-in-lens detector with integrated electron energy filter (r-filter) and an in-the-lens Schottky field emission gun – to deliver ultrahigh spatial resolution with a wide range of probe currents for all applications (1pA to more than 200 nA). The JSM-7610FPlus offers true 1,000,000X magnification with 0.8nm resolution at 15kV (1.0nm at 1kV) and unmatched beam stability, making it possible to observe the fine surface morphology of nanostructures.
Ultrahigh spatial resolution.
- In-Lens Thermal Field Emission Gun
- Aperture angle control lens (ACL) to automatically optimize the spot size at both high and low currents for both analysis and imaging
- High probe current up to 200 nA (at 15 kV) for various analytical techniques (WDS, EDS, EBSD, CL, etc.)
- Built-in r-filter enabling user selectable mixture of secondary electron and backscattered electron images
- Gentle Beam mode for top-surface imaging, reduced beam damage and charge suppression
- A standard LABE detector for detecting very low energy and very low angle backscattered electrons
- Eco design for energy conservation
- Large specimen chamber (200mm diameter sample)
