JCM-7000 NeoScope by JEOL USA

Manufacturer JEOL USA
Benchtop SEM


JCM-7000 NeoScope by JEOL USA product image
JCM-7000 NeoScope
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An easy to use benchtop SEM with advanced features of full-sized SEMs. User can easily navigate from an optical image to high resolution SEM imaging and further analysis, set automatic conditions based on sample type and application, ensuring high quality results and enhanced productivity. Produces images of exceptional fidelity. Simple to use for any skill level to obtain outstanding SEM images and elemental analysis results in minutes. Large specimen chamber High and low vacuum modes Secondary and backscatter electron detectors Real-time 3D imaging Option to add a fully embedded EDS with real-time, ‘Live’ analysis High resolution (100,000X) and large depth of field Selectable kV modes.