IT500 InTouchScope SEM Series by JEOL USA

Manufacturer JEOL USA
4.7
/
5.0
  |  5 reviews
Versatile Research Grade SEM


IT500 InTouchScope SEM Series by JEOL USA product image
IT500 InTouchScope SEM Series
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Average Rating: 4.7
5 Scientists have reviewed this product

4 out of 5
Ease of use
5 out of 5
After sales service
5 out of 5
Value for money


  • Status:

    Reviewer
  • Member since: 2020

  • Organization: BAE



  • Ease of use
    5 out of 5
    After sales service
    5 out of 5
    Value for money
    5 out of 5
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Love using this instrument.
Rating: 5.0

  • Application Area: Analyzing crystal shapes

"The product is very easy to use and gives very interesting results."

Review date: 16 Mar 2020 | IT500 InTouchScope SEM Series
  • Status:

    Reviewer

  • Member since: 2020

  • Organization: Ascend Perfrommabce Material



  • Ease of use
    5 out of 5
    After sales service
    5 out of 5
    Value for money
    5 out of 5
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Great value and capability. Very reliable.
Rating: 5.0

  • Application Area:Imaging metals and polymers

"Very reliable compared to other suppliers. Service after sale has been exemplary."

Review date: 03 Mar 2020 | IT500 InTouchScope SEM Series
  • Status:

    Reviewer

  • Member since: 2019

  • Organization: NIT Silchar



  • Ease of use
    3 out of 5
    After sales service
    4 out of 5
    Value for money
    4 out of 5
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A good SEM at a lower cost
Rating: 3.7

  • Application Area:Ground surface

"Used to get secondary images of the ceramic surface - found it to be excellent as the images have high contrast. It has the lowest price in its segment, as far as I believe, considering the features."

Review date: 17 Dec 2019 | IT500 InTouchScope SEM Series
  • Status:

    Reviewer

  • Member since: 2017

  • Organization: Cementos Progreso, S. A.



  • Ease of use
    4 out of 5
    After sales service
    5 out of 5
    Value for money
    5 out of 5
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Great Instrument, a powerful piece of equipment for today's scientist.
Rating: 4.7

  • Application Area:Phase analysis, micro structural studies, nano materials research

"The IT 500 SEM from JEOL is a very powerful piece of the finest equipment. Easy to use, very high speed image acquiring and scanning, and with very high precision for EDS and EBSD data collection."

Review date: 19 Mar 2018 | IT500 InTouchScope SEM Series
  • Status:

    Reviewer

  • Member since: 2017

  • Organization: Cementos Progreso, S. A.



  • Ease of use
    5 out of 5
    After sales service
    5 out of 5
    Value for money
    5 out of 5
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Very easy to use, great resolution, reliability, is"THE" SEM for the R&D Today´s lab
Rating: 5.0

  • Application Area:Mineral, cement, construction materials microscopy, clinker mineralogical microscopy, lime, with EDS

"The IT 500 Scanning Electron Microscope is very easy to install, easy to use, and has a fully automated navigation system, combined with optical and IR camera to achieve a perfect sample positioning, protecting the asset. Great resolution, a very good after sale following, (with the MEXICO JEOL sales team), and a very good operating instruction manual and videos, so you can easily start to use with basic training needed. Very low energy consumption, very good price/quality ratio, and combined with EDS (Energy Dispersive Spectroscopy)and EBSD (Electron Back Scatter Diffraction), OXFORD detectors, is a powerful tool for material research. Very good image inter phase and fast report acquisition."

Review date: 13 Dec 2017 | IT500 InTouchScope SEM Series

Smart – Flexible – Powerful

Smart – The latest innovations for our InTouchScope™ series SEMs are designed to make SEM accessible to everyone. All the controls are at your fingertips with an intuitive software interface. Seamless navigation across the sample allows you to quickly go from an optical image to high resolution SEM imaging and analysis.

Flexible –Choose a platform that is right for you. We offer high vacuum and low vacuum models with or without our embedded EDS system [JSM-IT500, JSM-IT500A, JSM-IT500LV, JSM-IT500LA].  This platform has a large sample chamber with multiple ports which are optimally positioned for analytical attachments such as: energy dispersive X-ray spectrometer (EDS), electron backscatter diffraction (EBSD), cathodoluminescence detectors (CL), wavelength dispersive X-ray spectrometer (WDS), chamberscopes, heating/cooling sub-stages, etc.

Powerful – High resolution W filament gun (LaB6 option) with unsurpassed low kV performance. Large analytical chamber and stage can cover samples as large as 178mm (d) by 80mm (h). The stage is mounted inside the chamber enabling users to secure large, heavy and odd shaped objects on the stage with clear positioning prior to evacuating the chamber.  Our integrated color camera allows for intuitive navigation to the area of interest and our embedded EDS brings fast quantitative elemental characterization.

Live Analysis
Our analytical series includes JEOL’s fully embedded EDS system which provides real time EDS spectra during image observation. With Live Analysis you can:

  • View EDS spectra in real time as you search for the area of interest.
  • Set analysis points, areas, map positions and line scans from the live image observation screen
  • Major elements are displayed on the live image observation screen
  • Set a color-coded alert for user-specified elements of interest.