CryoARM™ 300/CryoARM™200/ by JEOL USA

Manufacturer JEOL USA
Field Emission Cryo-electron Microscope


CryoARM™ 300/CryoARM™200/ by JEOL USA product image
CryoARM™ 300/CryoARM™200/
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The CRYO ARM™ 300 achieves unprecedented resolution and stability thus allowing for the automatic and unattended acquisition of image data for Single Particle Analysis. JEOL's Cryo-EM systems are achieving new benchmarks in high resolution structure determination. Single Particle Analysis (SPA) has progressed to the point where structures can be determined routinely to better than 2Å on a 300 kV microscope.

  • Automated specimen exchange system
  • Cold field emission gun (Cold FEG)
  • In-column energy filter (Omega filter)
  • Hole-free phase plate (optional)
  • Auto adjustment functions to enable image acquisition under optimum conditions

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CryoARM™ 300/CryoARM™200/ by JEOL USA product image

CryoARM™ 300/CryoARM™200/

Manufacturer JEOL USA

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