alpha300 RS Correlative Raman and Scanning Near-field Optical Microscope by WITec GmbH

Manufacturer WITec GmbH
5.0
/
5.0
  |  1 reviews
 The RS combines all features of the alpha300 S and alpha300 R and many AFM operation modes.


alpha300 RS Correlative Raman and Scanning Near-field Optical Microscope by WITec GmbH product image
alpha300 RS Correlative Raman and Scanning Near-field Optical Microscope
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Average Rating: 5.0
1 Scientist has reviewed this product

5 out of 5
Ease of use
5 out of 5
After sales service
5 out of 5
Value for money


  • Status:

    Reviewer
  • Member since: 2021

  • Organization: TU Wien



  • Ease of use
    5 out of 5
    After sales service
    5 out of 5
    Value for money
    5 out of 5
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High resolution images and user friendly! Great instrument!
Rating: 5.0

  • Application Area: Bitumen and pollen

"We have purchased this instrument to measure pollen and bitumen. Alpha 300 RS is great to characterize samples on the submicro level! With SNOM we were able to achieve beyond diffraction limit resolution! User friendly and open for experimenting with the instrumentation settings! "

Review date: 09 Feb 2021 | alpha300 RS Correlative Raman and Scanning Near-field Optical Microscope

For the user with challenging experimental requirements, the alpha300 RS facilitates confocal Raman imaging in combination with Scanning Near-field Optical Microscopy for optical imaging with resolution beyond the diffraction limit. It combines all features of the alpha300 S and alpha300 R and many AFM operation modes. Furthermore the combined Raman-SNOM microscope is ideally suited for high-resolution Raman imaging techniques such as nearfield-Raman imaging.

Key Features

  • All features of the alpha300 R (Raman) and the alpha300 S (SNOM) microscope provided in one instrument
  • Excellent combination of high-resolution surface imaging (SNOM) and chemical imaging (Raman)
  • Ideally suited for combined techniques such as near-field Raman imaging
  • Convenient switching between the measurement techniques is realized by a rotation of the objective turret
  • Sample movement between the measurements not necessary