X-Cite Optical Power Measurement System
The X-Cite® Optical Power Measurement System includes both the X-Cite® XR2100 Power Meter and the X-Cite® XP750 Objective Plane Power Sensor. Designed for measuring optical power in watts at the specimen level, the X-Cite® XP750 has a low, sleek profile that fits on the microscope stage and offers the versatility of measuring power output from an X-Cite® illuminator or any other epi-fluorescence light source.
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Consistent illumination for all research experiments!
Measuring power output from an X-Cite microscope illuminator or any other epi-fluorescence light
The X-Cite Optical Power Measurement System is designed for measuring optical power at the specimen level that enables consistent and repeatable illumination throughout research experiments, and also assists in equipment set-up and troubleshooting. The system includes the X-Cite XP750 sensor which is sleek and fits on the microscope stage and offers the versatility of measuring power output from an X-Cite microscope illuminator or any other epi-fluorescence light source. By fitting a wide dynamic range into this compact sensor, it is easier than ever to obtain this critical information. It is easy to use, and read. We have had no issues.
Review Date: 17 Nov 2021 | Lumen Dynamics
The X-Cite® Optical Power Measurement System includes both the X-Cite® XR2100 Power Meter and the X-Cite® XP750 Objective Plane Power Sensor. Designed for measuring optical power in watts at the specimen level, the X-Cite® XP750 has a low, sleek profile that fits on the microscope stage and offers the versatility of measuring power output from an X-Cite® illuminator or any other epi-fluorescence light source.
Sensitized Emission FRET Measurements Using White-light TIRF Microscopy
This application note describes the acquisition of TIRF images using a broadband X-Cite® mercury light source without the cost of a laser and less photobleaching. This technique opens up advanced imaging to more researchers who want an affordable alternative that minimizes photobleaching associated with other technologies.
The X-Cite® Power Meter: An Important Addition to Any Quantitative Fluorescence Microscopy Toolkit
This application note describes the common issues with illumination in a multi-user microscopy facility. It shows, with two examples, how measuring laser power at the sample plane provides crucial information on the performance of these confocal microscopy systems.
