Sensitized Emission FRET Measurements Using White-light TIRF Microscopy

1 Sept 2011

This application note describes the acquisition of TIRF images using a broadband X-Cite® mercury light source without the cost of a laser and less photobleaching. This technique opens up advanced imaging to more researchers who want an affordable alternative that minimizes photobleaching associated with other technologies.

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Sensitized Emission FRET Measurements Using White-light TIRF Microscopy