Latest: How the Bio-Rad Academy is leading the way in ‘advancing science and saving lives’
Latest: Volumetric dried blood sampling in a patient and lab friendly device – A game-changer...
Latest: Small molecule therapeutics continue to have a big impact on the pharmaceutical industry
Latest: The new OV 625 Digital dispenser
Latest: Free webinar: Analytical methodology to quantify compostable plastics in compost
Latest: How scientists are looking after their local community
Latest: Malvern Panalytical acquire X-ray diffraction product line
How the Bio-Rad Academy is leading the way in ‘advancing science and saving lives’
Nominate your favorite new lab product of 2023 for a Scientists’ Choice Award
Dr Farid Khan, PharmaKure CEO, to speak on Alzheimer's diagnosis and treatment at Biotech...
Starlab sustainability drive: Over 3,000 cacti send a clear message for sustainable lab practices
5 ways in which bioreactors can help with the global challenges of the 21st century
Modeling the tumor microenvironment
Managing the risk of nitrosamines in medicinal drugs
Your essential guide to preparative LC
Is avian flu causing a strain on the world?
Automating library preparation for rapid WGS-based diagnosis of rare diseases in the neonatal...
HPTLC: Unmatched precision and reproducibility
Consistent performance at a high degree: Thermo Scientific Furnaces
How to Buy Clinical Laboratory Automation Technology
Biophysical Characterization Technology
Cell Imaging Technology
The Festival of Genomics &...
24 Jan 24 - 25 Jan 24
03 Feb 24 - 07 Feb 24
MedLab Middle East
05 Feb 24 - 08 Feb 24
10 Feb 24 - 14 Feb 24
21 Feb 24 - 22 Feb 24
Precision ion polishing system for precise centering, control, and reproducibility of your milling process. Read more...
Ion Beam Cross Section Polisher (CP) Read more...
Ideal for low energy surface preparation for your SEM cross section viewing. Read more...
The Hitachi IM4000 Ar Ion Milling System offers two milling configurations available in a single instrument: cross section cutting and wide-area sample surface fine polishing. The new Ar ion gun design, with increased milling rate (300... Read more...
The Triple Ion Beam Cutter, Leica EM TIC 3X allows production of cross sections of hard/soft, porous, heat sensitive, brittle and heterogeneous material for Scanning Electron Microscopy (SEM), Microstructure Analysis (EDS, WDS, Auger, EBS... Read more...
The Leica EM TXP is a target preparation device for milling, sawing, grinding, and polishing samples prior to examination by SEM, TEM, and LM techniques. Read more...
Revolutionary ultra-low-energy, concentrated ion beam Fischione’s Model 1040 NanoMill® TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscop... Read more...
High-quality thin foils for TEM Electrolytic thinning of conductive materials is an effective method of quickly producing specimens for transmission electron microscopy (TEM) without any induced artifacts. In the Model 110 Twin-Jet Elec... Read more...