Latest: 5 expert webinars you won't want to miss
Latest: Abbott's Panbio Rapid Antigen Test gains CE Mark for use on children
Latest: Accelerating microbiome research: The new reference material improving data quality
Latest: What the UK’s FSA wants to see on submissions for CBD product authorization
Latest: Promoting more sustainable mining practices with Malvern Panalytical’s water monitoring...
Latest: 5 expert webinars coming up this week
Latest: New Cypher VRS1250 video-rate atomic force microscope enables true video-rate imaging at...
Accelerating microbiome research: The new reference material improving data quality
‘Effective communication enables you to stand on other people's shoulders and see much further'
Biotinylated heparan sulfate antibodies
New Rigaku handheld LIBS analyzer provides high-performance metal alloy analysis
Access your free cancer and immunology resources ahead of the virtual summit
5 expert webinars you won't want to miss
Increasing LC-MS accessibility for streamlined biotherapeutic analysis
The essential guide to ELISA automation
Nexsa G2 Surface Analysis System: Fast travel to definitive surface analysis
Magnis NGS Prep System brochure
Agilent NovoCyte Advanteon flow cytometer brochure
Agilent Seahorse XF live-cell metabolism solutions for cancer research
DNA/RNA Purification and Analysis
Pre-Clinical and Clinical Automation
Cell Counting Technology
Cell Analysis Microscopy Equipment
Virtual Analytical Summit
SelectScience Virtual Summit...
11 May 21 - 12 May 21
21 May 21 - 25 May 21
07 Jun 21 - 11 Jun 21
22 Jun 21 - 23 Jun 21
SLAS Europe 2021
22 Jun 21 - 25 Jun 21
chieving high quality cross-sections of almost any material, revealing the internal structures of the sample with scarcely any deformation or damage was never before more convenient than now, using the Leica EM TIC 3X. The Triple Ion Bea... Read more...
Ion Beam Cross Section Polisher (CP) Read more...
Precision ion polishing system for precise centering, control, and reproducibility of your milling process. Read more...
Ideal for low energy surface preparation for your SEM cross section viewing. Read more...
The Hitachi IM4000 Ar Ion Milling System offers two milling configurations available in a single instrument: cross section cutting and wide-area sample surface fine polishing. The new Ar ion gun design, with increased milling rate (300... Read more...
Revolutionary ultra-low-energy, concentrated ion beam Fischione’s Model 1040 NanoMill® TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscop... Read more...
High-quality thin foils for TEM Electrolytic thinning of conductive materials is an effective method of quickly producing specimens for transmission electron microscopy (TEM) without any induced artifacts. In the Model 110 Twin-Jet Elec... Read more...