Preparative Ion Milling / Polishing

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Showing 1 - 8 of 8 results

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Leica EM TIC 3X Ion Beam Milling System

Leica Microsystems EMEA



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Leica EM TXP Target Surfacing System

Leica Microsystems EMEA



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Cross Section Polisher

JEOL USA



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PIPS II System

(2)

Gatan Inc.



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Ilion II System

Gatan Inc.



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IM4000 Ion Milling System

Hitachi High Technologies America, Inc.



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Model 1040 NanoMill® TEM specimen preparation system

E.A. Fischione Instrumental Inc.



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Automatic Twin-Jet Electropolisher

E.A. Fischione Instrumental Inc.