JEOL USA Products

Electron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.
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JSM-7900F

(1)

JEOL USA



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JEM-1400 Flash TEM

(8)

JEOL USA



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JSM-7610FPlus

(3)

JEOL USA



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JXA-8530F

(1)

JEOL USA



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JEM-1400Flash

JEOL USA



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Cross Section Polisher

JEOL USA



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JAMP-9510F

JEOL USA



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JCM-7000 NEOSCOPE BENCHTOP SEM

JEOL USA



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JSM-IT800 series

JEOL USA



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JEM-1400Flash

JEOL USA



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IB-29510VET Vacuum Evaporator

JEOL USA



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JEM-F200

JEOL USA



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JIB-4000PLUS

JEOL USA



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JBX-8100FS

JEOL USA



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JBX-9500F

JEOL USA