Electron Microscopy

Electron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.

Rating

(28)

& Up (52)

& Up (53)

& Up (53)

& Up (53)

Featured Brands

HORIBA Scientific (2)

Leica Microsystems EMEA (10)

SPT Labtech (1)

ZEISS Research Microscopy Solutions (13)

Thermo Fisher Scientific (38)

Agar Scientific Ltd (1)

ASPEX, LLC (1)

Bruker-Nano (2)

E.A. Fischione Instrumental Inc. (6)

EDAX International, Inc. (1)

Electron Microscopy Sciences (2)

Gatan Inc. (5)

Hitachi High Technologies America, Inc. (18)

Hitachi High-Technologies Corp (Microscopy) (2)

JEOL USA (33)

Oxford Instruments Inc. (4)

Oxford Instruments NanoAnalysis (7)

Raith Nanofabrication (1)

Scienion (1)

Shinkuu (1)

Ted Pella Inc. (4)

Tescan (3)

Thermo Fisher Scientific (38)

WITec GmbH (1)

ZEISS Research Microscopy Solutions (13)


Showing 1 - 25 of 157 results

Sort by

Product Image

chameleon

SPT Labtech



Product Image

Ultra-high Resolution Scanning Electron Microscope S-5500

(3)

Hitachi High-Technologies Corp (Microscopy)



Product Image

Ultim® Extreme

(2)

Oxford Instruments NanoAnalysis



Product Image

ZEISS GeminiSEM for Life Sciences

(1)

ZEISS Research Microscopy Solutions



Product Image

AZtecWave

(1)

Oxford Instruments NanoAnalysis



Product Image

Product Image

TM3030

(1)

Hitachi High Technologies America, Inc.



Product Image

SU8200 Series CFE SEM

(1)

Hitachi High Technologies America, Inc.



Product Image

X-act - 10mm2 SDD Detector

(2)

Oxford Instruments Inc.



Product Image

Product Image

Symmetry® S2

(1)

Oxford Instruments NanoAnalysis



Product Image

Krios™ G3i Cryo-TEM for Life Sciences

(1)

Thermo Fisher Scientific



Product Image

S-3400N Fully Automated VP SEM

(2)

Hitachi High Technologies America, Inc.



Product Image

SEM Specimen Stubs

(2)

Agar Scientific Ltd



Product Image

ZEISS Elyra 7 with Lattice SIM

(8)

ZEISS Research Microscopy Solutions



Product Image

PIPS II System

(2)

Gatan Inc.



Product Image

Analytical TableTop Microscope TM3000

(2)

Hitachi High Technologies America, Inc.



Product Image

OmniProbe 400

(1)

Oxford Instruments NanoAnalysis



Product Image

3D EDS Analysis

(1)

Oxford Instruments Inc.



Product Image

ZEISS EVO Family

(5)

ZEISS Research Microscopy Solutions



Product Image

X-Max SDD Detector

(2)

Oxford Instruments Inc.



Product Image

Thermo Scientific™ Talos™ Arctica™ TEM for Life Sciences

(1)

Thermo Fisher Scientific



Product Image

SU6600 Analytical VP FE-SEM

(1)

Hitachi High Technologies America, Inc.



Product Image

Themis TEM

(1)

Thermo Fisher Scientific