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AFM / STM

Atomic force microscopes (AFM) and scanning tunneling microscopes (STM) are high-resolution forms of scanning probe microscope (SPM) used to generate topological information of a sample down to the atomic scale. Instruments can generate an image of the surface topology, manipulate objects and reveal information on localized properties such as Young’s modulus, conductivity, and magnetism. High-quality STM and AFM probes optimized for your application are available, as well as other SPM-based instruments such as scanning ion conductance microscopes (SICM) & near-field scanning optical microscopes (NSOM). Find the best AFM and STM equipment in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.

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Showing 1 - 25 of 80 results

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Park FX40 AFM

(2)

Park Systems



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Park NX20 AFM

Park Systems



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Park NX-Hivac

Park Systems



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Park NX10 AFM

(2)

Park Systems



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Park NX-Wafer

Park Systems



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Cypher™ AFM

(4)

Asylum Research



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BioScope Catalyst™ BioAFM

(1)

Bruker



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MFP-3D-BIO™

(1)

Asylum Research



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MFP-3D™ Stand Alone AFM

(4)

Asylum Research



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Park NX7

Park Systems



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MFP-3D-CF™ AFM

Asylum Research



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attoMFM I

Attocube Sytems, AG



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attoSHPM

Attocube Sytems, AG



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attoFPSensor

Attocube Sytems, AG



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attoAFMsolutions

Attocube Sytems, AG



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ASC500

Attocube Sytems, AG



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ANPx101/RES Positioner

Attocube Sytems, AG



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ANPx101/NUM Positioner

Attocube Sytems, AG



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NSG01 AFM Mode Non-Contact Probe

K-TEK Nanotechnology



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NSG03 AFM Mode Non-Contact Probe

K-TEK Nanotechnology



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NSG10 AFM Mode Non-Contact Probe

K-TEK Nanotechnology



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NSG20 AFM Mode Non-Contact Probe

K-TEK Nanotechnology



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NSG30 AFM Mode Non-Contact Probe

K-TEK Nanotechnology



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FMG01 AFM Mode Non-Contact Force Modulation Probe

K-TEK Nanotechnology



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CSG01 AFM Mode Contact Probe

K-TEK Nanotechnology