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Rigaku Corporation

Rigaku will attend the 2017 Materials Science and Technology meeting, promoting its latest X-ray analytical solutions

19 Sept 2017
Finn Price
Administrator / Office Personnel

Industry news

Rigaku Corporation has announced its attendance at the 2017 Materials Science and Technology meeting and exhibition (MS&T 17) at the David L. Lawrence Convention Center in Pittsburgh, PA, October 8-12, 2017.

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Rigaku will represent its latest lines of X-ray analytical instrumentation at Booth # 608.

MS&T is the annual materials science conference presented by four technical societies. It offers a unique technical program addressing structure, properties, processing and performance across the materials community. The exposition showcases a wide variety of equipment and services to the automotive, aerospace, instrumentation, medical, oilfield and energy industries.

Rigaku is dedicated to the development of X-ray technology to probe the structure and composition of synthetic and natural materials and provides the world’s most complete line of X-ray diffraction and X-ray fluorescence instruments, including benchtop X-ray diffraction (XRD), X-ray fluorescence (XRF) and small angle X-ray scattering (SAXS) systems.

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X-ray CrystallographyX-ray crystallography is an analytical technique used to determine the arrangement of atoms in a crystal. Monochromatic x-rays are produced from a synchrotron or x-ray generator. An x-ray crystallography system uses a detector to measure the x-ray diffraction from the crystal. The information is used to generate a 3D image of the crystal.X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.X-Ray FluorescenceX-ray fluorescence (XRF) is an analytical technique used to determine the elemental composition of materials. It is widely used in geology, materials science, and environmental testing for detecting heavy metals and other elements. Browse our peer-reviewed product directory to find the best XRF systems, compare products, check reviews, and get pricing directly from manufacturers.X-Ray SourceSpectroscopySpectroscopy is a technique that analyzes the interaction of light with matter to study molecular properties, concentrations, and structural information. Widely used in chemical, pharmaceutical, and environmental analysis, spectroscopy offers insights into molecular composition and helps identify unknown compounds. It plays a key role in quality control, research, and diagnostics. Browse our peer-reviewed product directory to compare spectroscopy tools, read reviews, and get prices directly from manufacturers.

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See the Latest X-Ray Analytical Technology at MS&T17