Hysitron PI 89 SEM PicoIndenter

In this application note, Bruker Nano provides a detailed overview of the Hysitron^® PI 89 SEM PicoIndenter^®. This nanomechanical test instrument leverages the advanced imaging capabilities of scanning electron microscopes (SEM, FIB/SEM), making it possible to perform quantitative nanomechanical testing while simultaneously imaging. Based upon Bruker’s capacitive transducer technology, this new system is the next-generation descendant of the first commercial, in-situ SEM nanomechanics platform.