Explore the Dimension Edge with ScanAsyst
22 Jun 2023In this application note, explore the Dimension Edge™ Atomic Force Microscope (AFM) which incorporates Bruker’s PeakForce Tapping® technology to provide the high levels of performance, functionality, and accessibility. Based on the Dimension Icon® platform, the Edge system has been designed from top to bottom to deliver the low drift and low noise necessary to achieve publication-ready data in minutes instead of hours, all at price points well below expectations for such performance. Furthermore, explore how ScanAsyst® imaging, integrated visual feedback, and preconfigured settings enable expert-level results simply and consistently.
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Dimension Icon
Bruker Nano Surfaces and MetrologyBruker’s Dimension Icon brings the highest levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world’s most utilized large-sample AFM platform, it is the culmination of decades of technological innovation, customer feedback, and industry-leading application flexibility.
Dimension Edge™ AFM platform
Bruker Nano Surfaces and MetrologyAtomic Force Microscopy for Patterned Sapphire Substrates Delivering advanced automated metrology and production capabilities with superior resolution for now and the future. Bruker's Dimension Edge™ PSS Atomic Force Microscope with AutoMET™ Metrology Analysis Software is the ideal nano-metrology and nano-inspection system for LED substrate and epitaxial manufacturers. As an extension of the Dimension Edge AFM platform, the Edge PSS incorporates the incredible value and resolution for which the Dimension AFM systems are renowned, while also providing a specialized solution for substrate measurements. The system incorporates Bruker's proprietary AutoMET metrology analysis software, which has been designed specifically to meet the needs of patterned sapphire substrate (PSS) suppliers, providing a level of automation and ease of use never before seen in a value-price atomic force microscope.