UVISEL Plus Spectroscopic Ellipsometer by HORIBA Scientific

Manufacturer HORIBA Scientific
4.7
/
5.0
  |  1 reviews
The Reference Ellipsometer for Thin Film Measurements The UVISEL Plus ellipsometer range offers the best combination of modularity and performance for advanced thin film, surface and interface characterization. The new UVISEL Plus includes the newest acquisition technology designed to measure faster and more accurately than ever. FastAcq, the newest acquisition technology, is based on double modulation, designed for real world thin film characterization.


UVISEL Plus Spectroscopic Ellipsometer by HORIBA Scientific product image
UVISEL Plus Spectroscopic Ellipsometer
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Average Rating: 4.7
1 Scientist has reviewed this product

5 out of 5
Ease of use
5 out of 5
After sales service
4 out of 5
Value for money


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    Expert Reviewer
  • Member since: 2020

  • Organization: A.D.Patel Institute of Technology



  • Ease of use
    5 out of 5
    After sales service
    5 out of 5
    Value for money
    4 out of 5
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Good product! Reproducible data achieved every time.
Rating: 4.7

  • Application Area: Semiconductors

"This product is low efforts and you can save your time while getting your results. Advanced features are embedded in this product. Optical gain is also very good."

Review date: 10 Feb 2021 | UVISEL Plus Spectroscopic Ellipsometer

The Reference Ellipsometer for Thin Film Measurements

The UVISEL Plus ellipsometer range offers the best combination of modularity and performance for advanced thin film, surface and interface characterization.
The new UVISEL Plus includes the newest acquisition technology designed to measure faster and more accurately than ever. FastAcq, the newest acquisition technology, is based on double modulation, designed for real world thin film characterization.

Product Overview

UVISEL Plus Spectroscopic Ellipsometer by HORIBA Scientific product image

UVISEL Plus Spectroscopic Ellipsometer

Manufacturer HORIBA Scientific

4.7 / 5.0 | 1 reviews