Member since: 2020
Organization: A.D.Patel Institute of Technology
Good product! Reproducible data achieved every time.
Application Area: Semiconductors
"This product is low efforts and you can save your time while getting your results. Advanced features are embedded in this product. Optical gain is also very good."
The Reference Ellipsometer for Thin Film Measurements
The UVISEL Plus ellipsometer range offers the best combination of modularity and performance for advanced thin film, surface and interface characterization.
The new UVISEL Plus includes the newest acquisition technology designed to measure faster and more accurately than ever. FastAcq, the newest acquisition technology, is based on double modulation, designed for real world thin film characterization.