High-resolution STEM imaging
The Model 3000 Annular Dark Field (ADF) Detector is ideal for high-resolution scanning transmission electron microscopy (STEM) imaging. It allows simultaneous high angle ADF imaging and electron energy less spectroscopy (EELS). It has single electron detection capabilities and high quantum efficiency. The detector is pneumatically retractable from the beam path.
Atomic-resolution imaging and Z-contrast
High angle ADF STEM images are formed by collecting electrons that have been forward scattered through high angles. For high angles, elastic and inelastic interactions between the incident electrons and the columns of atoms within the specimen produce image contrast. Since the nuclei of the target atoms are involved, the strength of scattering varies with atomic number. The Model 3000 ADF Detector captures these highly scattered electrons yielding both atomic-resolution imaging and Z-contrast information.
The Fischione Model 3000 Annular Dark Field (ADF) Detector incorporates a single crystal yttrium aluminum perovskite (YAP) scintillator optically coupled to a photomultiplier tube.