EPMA-8050G Electron Probe Microanalyzer
This instrument is equipped with a cutting-edge FE electron optical system, which provides unprecedented spatial resolution under all beam current conditions, from SEM observation conditions up to 1 μA order. Integration with high performance X-ray spectrometers that Shimadzu has fostered through the company's traditions achieves the ultimate advance in analysis performance.
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This instrument is equipped with a cutting-edge FE electron optical system, which provides unprecedented spatial resolution under all beam current conditions, from SEM observation conditions up to 1 μA order. Integration with high performance X-ray spectrometers that Shimadzu has fostered through the company's traditions achieves the ultimate advance in analysis performance.
Features:
- Unprecedented spatial resolution
- Large beam current enabling ultra high sensitivity analysis
- Up to five high performance 4-inch x-ray spectrometers can be mounted
- Simple and easy-to-understand operations for all analyses
