Member since: 2019
Organization: University College London
Application Area: Materials
"By combining the peak force tapping with electrochemical operation in liquid, in addition to surface topography, the electrochemical AFM can also provide corresponding mechanical, and electrochemical feature mapping of the sample. With all the advantages of EC-AFM, it can deliver excellent performance for in-situ analysis with nano-scale resolution of electrochemical cell during electrochemical reactions."
Member since: 2019
User friendly simple equipment.
Application Area:Nanoscale surface studies
"We have achieved reliable results. Very good platform."
Member since: 2017
Organization: Laboratorio NEST -Scuola Normale Superiore
We are very satisfied!
Application Area:Semiconductor samples (SiO2, graphene, nanowires), polymeric samples
"The Bruker ICON AFM system was installed four years ago in our clean room facility and it revealed as a unique instruments for its capability to perform low-noise and high-resolution imaging for many users, on many kind of samples and with reliable performances! “ScanAsyst” mode preserves the AFM probes in good condition for weeks and allow to any student to be independent and to start the measurements after a short training. We have also the Quantitative Nano machanics (QNM) module, taht allows to perform spatially resolved measurements od mechanical properties of the sample (stiffness, adhesion, dissipation, Young's module) in real time. From this point of vies the system is pretty unique, allowing to acquire for each single point a complete force-vs-distance curve."
The Dimension Icon® Atomic Force Microscope brings new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. The culmination of decades of large-sample AFM technology, the system has been designed from top to bottom to deliver revolutionary low drift and low noise that allows users to achieve artifact-free images in minutes instead of hours.
The Icon is also equipped with proprietary ScanAsyst® automatic image optimization technology, which enables easier, faster, and more consistent results, regardless of user skill level. The Icon’s uncommon ease of use, ultimate performance, exceptional productivity, and superior versatility make it an ideal choice for practically every AFM application.
Dimension Icon Atomic Force Microscope Features: