Dimension Edge™ AFM platform

Scanning microwave impedance microscopy (sMIM) is an atomic force microscopy (AFM)-based technique for materials and device characterization. The reflected microwave signal from the tip-sample interface holds information of the electrodynamic properties of the sample surface underneath the tip apex. In this application note from Bruker, explore sMIM and its integration with Bruker’s versatile AFM platforms, such as the Dimension Icon® and Dimension Edge™ AFMs. Furthermore, discover how when combined with Bruker’s exclusive PeakForce Tapping® mode, it is possible to obtain sMIM results on delicate samples, such as carbon nanotubes.

Machine learning, is a powerful tool to establish the presence (or absence) of correlations between microstructure and bulk properties with its ability to flesh out relationships and trends that are difficult to establish otherwise. In this application note from Bruker, explore the use of deep learning tools, such as convolutional neural nets (CNNs), to explore atomic force microscopy (AFM) phase and PeakForce QNM® images of impact copolymers, a polymer blend of polypropylene with micro-sized domains of rubber.

In this application note, explore the Dimension Edge™ Atomic Force Microscope (AFM) which incorporates Bruker’s PeakForce Tapping® technology to provide the high levels of performance, functionality, and accessibility. Based on the Dimension Icon® platform, the Edge system has been designed from top to bottom to deliver the low drift and low noise necessary to achieve publication-ready data in minutes instead of hours, all at price points well below expectations for such performance. Furthermore, explore how ScanAsyst® imaging, integrated visual feedback, and preconfigured settings enable expert-level results simply and consistently.

Atomic force microscopy (AFM)-based conductivity measurements are a powerful technique for nanometer-scale electrical characterization on a wide range of samples. Tunneling AFM (TUNA), cover the lower current range (sub-pA up to nA). Bruker has developed an enhanced TUNA module with its proprietary PeakForce Tapping™ mode of operation that makes significant improvements to all three of these elements to enable exquisite tip-sample force control, quantitative nano-mechanical material property mapping through PeakForce QNM™, correlated nanoscale electrical property characterization through TUNA, and extreme ease of use through the ScanAsyst™ image optimization algorithms. A special probe has also been designed for use on particularly challenging samples. In this application note, explore the basics of PeakForce TUNA™, and compare it to standard Contact Mode–based TUNA.

PeakForce Tapping™ (PFT) and ScanAsyst™ (SA) are two atomic force microscope (AFM) imaging techniques that have been recently introduced by Bruker. In this application note, explore the underlying physical background, see how PFT fits into the framework of existing AFM modes, and discover the benefits of the new modes through application examples.