Member since: 2015
Organization: University of Arkansas
Reliable results, smart scanayst mode for scanning
Application Area: Surface modification
"This AFM is highly automated and reliable for a lot of surface analysis. We use it mostly for the roughness measurement. However, it did require a flat surface in order to have a relatively good image. "
The system incorporates Bruker's proprietary AutoMET metrology analysis software, which has been designed specifically to meet the needs of patterned sapphire substrate (PSS) suppliers, providing a level of automation and ease of use never before seen in a value-price atomic force microscope.