attoMFM I
Attocube attoMFM I - Low temperature magnetic force microscope, cantilever based The Attocube attoMFM I is a compact magnetic force microscope designed particularly for applications at low and ultra low temperature. Based on a conventional atomic force microscope, the attoMFM I instrument works by scanning the sample below a fixed magnetic cantilever. The magnetic force gradient acting on the attoMFM I tip is then determined…
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Attocube attoMFM I - Low temperature magnetic force microscope, cantilever based
The Attocube attoMFM I is a compact magnetic force microscope designed particularly for applications at low and ultra low temperature. Based on a conventional atomic force microscope, the attoMFM I instrument works by scanning the sample below a fixed magnetic cantilever. The magnetic force gradient acting on the attoMFM I tip is then determined by measuring the change in resonance frequency (FM mode) or phase of the cantilever (AM mode) with highest precision using a fiber-based optical interferometer. Both measurements techniques are applied at a certain tip-sample distance, typically around 10 - 100 nm. In FM mode, a phase-locked loop (PLL) is used to excite the cantilever at resonance.
Attocube Magnetic Force Microscope, attoMFM I, Key Features:
• Ultra compact MFM head
• Highly sensitive interferometric deflection detection
• Unreached stability
• Optical inspection of sample / tip via CCD camera
• Adjustment of the cantilever outside the cryostat prior to cooling the microscope
Benefits of the attoMFM I:
• Fits standard cryogenic and magnet sample spaces
• Highest measurement sensitivity
• Simultaneous ultra high resolution topographic and
magnetic force imaging
• Compatible with any commercially available MFM probe
