Apreo™ SEM for Materials Science by Thermo Fisher Scientific

Manufacturer Thermo Fisher Scientific  |   Model: APREOSEM  |  Available Worldwide
  |  1 reviews
The most versatile high-performance SEM.

Apreo™ SEM for Materials Science by Thermo Fisher Scientific product image
Apreo™ SEM for Materials Science

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Average Rating: 5.0
1 Scientist has reviewed this product

5 out of 5
Ease of use
5 out of 5
After sales service
5 out of 5
Value for money

  • Status:

  • Member since: 2019

  • Organization: University of Washington

  • Ease of use
    5 out of 5
    After sales service
    5 out of 5
    Value for money
    5 out of 5
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Great instrument, improves my research a lot.
Rating: 5.0

  • Application Area: Analyze nanoparticles on glass substrate

"it is fast and user friendly. I like to use it. Preparing my sample on glass substrate make my research easier!"

Review date: 15 Nov 2019 | Apreo™ SEM for Materials Science

The most versatile high-performance SEM. The Thermo Scientific™ Apreo scanning electron microscope's (SEM) revolutionary compound lens design combines electrostatic and magnetic immersion technology to yield unprecedented resolution and signal selection. This makes the Apreo SEM the platform of choice for research on nanoparticles, catalysts, powders and nanodevices, without compromising on magnetic sample performance. The Apreo SEM benefits from the unique in-lens backscatter detection, which provides excellent materials contrast, even at tilt, short working distance, or on sensitive samples. The novel compound lens further improves contrast with energy filtering and adds charge filtering for imaging of insulating samples. The optional low vacuum mode now has a 500 Pa maximum chamber pressure for imaging even the most demanding insulators. With all these options, including the compound final lens, advanced detection and flexible sample handling, the Apreo SEM's performance and versatility will meet your research challenges for many years to come.

Experience the advantages of the Apreo SEM:

  • The unique compound final lens delivers an exceptional resolution of 1.0 nm at 1 kV, without the need for beam deceleration - on any sample, even if it is tilted or topographic. 
  • The most useful backscatter detection - materials contrast is always available, even at low voltage and beam currents, at any tilt angle, on beam sensitive samples and at TV-rate imaging.
  • Unparalleled detector flexibility - obtain the contrast or signal intensity that matters most by combining information from individual detector segments.
  • The widest range of charge mitigation strategies , including a low vacuum mode with a chamber pressure of up to 500 Pa to enable imaging of any sample.
  • A superior analytics platform provided by high beam currents and a small spotsize. The chamber supports three EDS detectors, coplanar EDS & EBSD, and low vacuum optimized for analytics.
  • Easiest sample handling and navigation with the multi-purpose sample holder and the Nav-Cam+.
  • Expert results for new users through advanced user guidance, presets and undo functionality.