alpha300 S Scanning Near-field Optical Microscope

WITec’s alpha300 S pushes the range of optical microscopy beyond the diffraction limit. Near-field measurements, which show details hidden from any other method, are easily performed with its cantilever-based SNOM technology. First introduced to the market by WITec, this configuration offers reliability and user friendliness that fiber tip-based SNOMs simply can’t match. The alpha300 A’s sensors are robust and consistent while providing sub-wavelength resolution.

Using the beam deflection principle common to atomic force microscopes makes every alpha300 S a fully-capable AFM as well. The micro-fabricated SNOM cantilevers allow optical and topography images to be acquired simultaneously. By simply rotating the objective turret, users can switch between conventional microscope objectives and the inertial drive positioner-equipped SNOM objective.

All standard optical modes such as transmission, reflection and fluorescence are available, as are all standard AFM modes when using AFM tips. The alpha300 S can be built to meet the challenge of a specific experiment, or it can upgraded as challenges emerge. It features rock-solid stability, the freedom of modularity, and an ease of use only available from the original SNOM innovator, WITec.

Applications:

• Semiconductor and materials science

• Plasmonics

• Nanotechnology

• Nanophotonics

• Life sciences

• Optical nanolithography