Application Note: XRD of gallium nitride and related compounds: strain, composition and layer thickness
3 April 2020

In this white paper, Malvern Panalytical  provides an introduction to the X-ray diffraction analysis of key structural parameters in epitaxial GaN layers. Fundamental crystallographic concepts are introduced and related to the specific requirements of the technological structures created for optoelectronic and electronic devices employing GaN and related compounds.