How can researchers reveal structure, composition, and behavior at the nanoscale?

Advances in nanomaterials are driving innovation across electronics, energy storage, semiconductors and advanced manufacturing. Characterizing these increasingly complex materials requires powerful microscopy and analytical techniques capable of visualizing nanoscale features, identifying chemical composition, and uncovering structure-property relationships with greater precision.

Advances in electron microscopy (EM), infrared (IR) microscopy, Raman microscopy, and next-generation detector technologies are helping researchers answer some of the most challenging questions in materials science. Improved resolution, faster acquisition speeds, and richer datasets are revealing details that were previously hidden, from nanoscale structural changes and crystallographic features to the chemical composition of complex, multilayer materials.

In this SelectScience editorial feature, explore the technologies and workflows enabling deeper materials insight. Discover how researchers are using advanced EM and four-dimensional scanning transmission electron microscopy (4D-STEM) to generate high-resolution nanoscale data, how infrared and Raman microscopy can reveal the composition of multilayer materials, and how complementary analytical techniques support confident materials characterization and regulatory compliance.