X-Ray Diffraction & Spectroscopy

X-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.

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Showing 1 - 25 of 187 results

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Eos CCD Detector

Agilent Technologies



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Epsilon 4 range

(3)

Malvern Panalytical



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Claisse rFusion

(1)

Malvern Panalytical



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Aeris Research edition - XRD

(5)

Malvern Panalytical



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Claisse Eagon 2

(1)

Malvern Panalytical



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Epsilon 1 range

(5)

Malvern Panalytical



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Claisse M4

(2)

Malvern Panalytical



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X'Pert3 MRD - XRD

(13)

Malvern Panalytical



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Zetium XRF

(27)

Malvern Panalytical



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Axios FAST WDXRF System

(13)

Malvern Panalytical



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CNA Pentos-Cement

(1)

Malvern Panalytical



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X'Pert3 MRD XL - XRD

(3)

Malvern Panalytical



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Epsilon 4 Mining & Minerals

(3)

Malvern Panalytical



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CNA3 cross-belt analyzer

(1)

Malvern Panalytical



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Zetium Cement XRF (Cement edition of Zetium)

Malvern Panalytical



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Zetium Minerals XRF (Minerals edition of Zetium)

Malvern Panalytical



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CNA Nickel

Malvern Panalytical