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ZEISS Xradia Versa X-ray Microscopes

Discover More with Non-destructive 3D X-ray Imaging at Submicron Resolution

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Application Area:

Faster Sub-Micron Imaging of Intact Samples

True spatial resolution of 500 nm with a minimum achievable voxel size of 40 nm High resolution across a broad range of sample types, sizes, and working distances. In situ imaging for non-destructive characterization of microstructures in controlled environments and over time upgradeable and extendible with future innovations and developments. High throughput with good image quality.

Review Date: 26 Mar 2022 | ZEISS Research Microscopy Solutions

Extremely versatile ZEISS Xradia Versa 3D X-ray microscopes (XRM) provide superior 3D image quality and data for a wide range of materials and working environments. Xradia Versa XRM feature dual-stage magnification based on synchrotron-caliber optics and revolutionary RaaD™ (Resolution at a Distance) technology for high resolution even at large working distances, a vast improvement over traditional micro-computed tomography. Non-destructive imaging preserves and extends the use of your valuable sample, enabling 4D and in situ studies.

  • Expanded access, productivity, capability - ZEISS Xradia 630 Versa
  • Wide range of capabilities - ZEISS Xradia 620 Versa
  • Faster submicron imaging - ZEISS Xradia 610 Versa
  • Flexibility and ease of use - ZEISS Xradia 510 Versa

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