High-resolution characterization of solid foams

19 Jun 2024

Characterization of the 3D morphology of solid foams is extremely important but has been limited due to the shortcomings of conventional techniques. High-resolution techniques such as physical sectioning coupled with optical or electron microscopy are not only destructive and time-intensive, but can also introduce physical artifacts. ZEISS highlights how the ZEISS Xradia Versa and the ZEISS Xradia Ultra series of 3D X-ray microscopes provide a unique solution for non-destructive submicron resolution and the highest contrast in foam imaging that can be achieved. Foam structures can be imaged to submicron spatial resolutions: down to 500 nm on ZEISS Xradia Versa and 50 nanometers on ZEISS Xradia Ultra.