FEI Teneo VS Serial Block Face Imaging Solution
4 Dec 2014
The Teneo VS™ SEM is a novel Serial Block Face Imaging solution that combines mechanical sectioning with virtual sectioning. Learn how this is achieved using FEI's proprietary Multi-Energy Deconvolution to facilitate automated acquisition of large sample volumes at isotropic resolution.
About the company
FEI Company
With more than 60 years of innovation and leadership, FEI enables customers to find meaningful answers to questions that accelerate breakthrough discover¬ies, increase productivity, and ultimately change the world. FEI designs, manu¬factures, and supports the broadest range of high-performance microscopy workflows that provide images and answers in the micro-, nano-, and picometer scales. Combining hardware and software expertise in electron, ion, and light microscopy with deep application knowledge in the materials science, life sci¬ences, electronics, and natural resources markets, the worldwide FEI team of 2,700+ employees is dedicated to customers’ pursuit of discovery and resolution to global challenges.
