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UltimaIV
Rigaku CorporationThe Ultima IV represents the state-of-the-art in multipurpose X-ray diffraction (XRD) systems. Incorporating Rigaku's patented cross beam optics (CBO) technology for permanently mounted, permanently aligned and user-selectable parallel and focusing geometries, the Ultima IV X-ray diffractometer can perform many different measurements fast.With a multipurpose diffractometer, performance is measured by not only how fast you per…
New Simultaneous WDXRF System for High-Throughput Analysis
Rigaku's Simultix 15 is the newest version of the popular multi-channel simultaneous wavelength dispersive X-ray fluorescence spectrometer system
HyPix-3000 2D Hybrid Pixel Array Detector
Rigaku CorporationRigaku’s HyPix-3000 is a next-generation two-dimensional semiconductor detector designed specifically to meet the needs of the home lab diffractionist. One of the HyPix-3000’s unique features is its large active area of approximately 3000 mm² with a small pixel size of 100 μm², resulting in a detector with high spatial resolution. In addition, the HyPix-3000 is a single photon counting X-ray detector with a high count rate of…
WaferX 310
Rigaku CorporationRigaku's WaferX 310 represents the culmination of 35 years of experience in the X-ray fluorescence analysis of thin films on silicon wafers. The WaferX 310 is ideal for measuring BPSG, PSG and metal films. In addition, thin film BPSG, multilayered circuit film, WSix, electrode films, ferrodielectric thin films, FRAM, next generation DRAM, and SiOF are standard applications for this tool.Highly accurate analyses for the ultral…
AZX 400 WDXRF
Rigaku CorporationRigaku's unique AZX 400 sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer was specifically designed to handle very large and/or heavy samples. Accepting samples up to 400 mm diameter, 50 mm thick and 30 kg weight, this system is ideal for analyzing sputtering targets, magnetic disks, or for multilayer film metrology or elemental analysis of large samples.Having the versatility to adapt to your specific…
Miniflex XpC – XRD for high-throughput quality control
Rigaku CorporationThe Miniflex XpC is an X-ray diffractometer designed specifically for quality control in cement plants and other operations requiring online process control such as pharmaceuticals and batteries. It has been optimized for speed and accuracy, bringing lab-quality performance to the manufacturing floor. With this in mind, the MiniFlex XpC allows you to process more samples faster, and to gain greater control over your process t…
Nippon Instruments' mercury measuring instrument wins environmental award 2023
NIC's RA-7000 recognized for environmental and economic efficiency in mercury measurement
Quantitative Analysis of Low Alloy Steel Using the Supermini200
Quantitative Analysis of Low Alloy Steel Using the Supermini200
New X-Ray Benchtop Technology
NANOHUNTER II - Total reflection X-ray fluorescence spectrometer
Analysis of Lead in Gasoline
Pt, Pd, Rh in Recycled Automotive Catalysts
The HyPix-3000 Shows High-Speed Performance in Impressive Display
The detector managed to determine the precise temperature range for the melting point of aliminium during a rapid-heating experiment