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Application Note

Cellular imaging insights

26 Jan 2026

Application Note

How to validate automated cell counters: Benefits of using validation slides over NIST standard beads

26 Nov 2025

Scientific Poster

Nanobeam 4D STEM with MerlinEM - The intersection between crystallography and microscopy

15 Oct 2025

Scientific Poster

TimePix 4 for imaging

14 Oct 2025

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Software-based segmentation of metallic inclusions of additive manufactured alloys – linking microstructure and materials properties

16 Jul 2025

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Streamline imaging, EDS and analysis

16 Jul 2025

Application Note

Connected productivity in the materials lab

16 Jul 2025

Application Note

Exploring the benefits of Hitachi’s SU8600 and SU8700 Field Emission SEMs

6 Jun 2025

Application Note

Broad ion beam milling with Hitachi’s IM4000II & ArBlade 5000

6 Jun 2025

Application Note

Introducing Hitachi’s SU3800SE and SU3900SE SEMs: Simplifying microscopy with easy, automatic operation

6 Jun 2025

Application Note

Optimizing SEM sample preparation with broad ion beam milling

6 Jun 2025

Application Note

Why electron microscopy is critical for battery research

6 Jun 2025

Application Note

The FlexSEM II: High-Resolution SEM Imaging in a surprisingly compact design

6 Jun 2025

Application Note

A look at tabletop SEMs

6 Jun 2025

Application Note

The importance of high-quality cross-sectioning for battery research

6 Jun 2025

Application Note

ArBlade 5000 – An innovative, high-performance sample preparation tool for SEM

7 Apr 2025

Application Note

The Hitachi TM4000PlusIII – Bringing high-performance SEM to the tabletop

25 Mar 2025

Product Brochures

Next generation of tabletop electron microscopes

21 Mar 2025

Product Brochures

FlexSEM: The smart little SEM that flexibly adjusts to your skills and needs

11 Feb 2025

Product Brochures

Hitachi Product Catalogue 2024/25- German

11 Feb 2025

Product Brochures

Hitachi Product Catalogue 2024/25- English

11 Feb 2025

Product Brochures

TM4000 Series Tabletop Microscopes

27 Nov 2024

Product Brochures

SE Series Scanning Electron Microscopes

27 Nov 2024

Application Note

Screening of copolymer nanodiscs with multi-parameter stability characterization on the Prometheus Panta

9 Oct 2024

Application eBook

Your guide to EDS analysis in electron microscopy

29 Jul 2024

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Cellular imaging insights

How to validate automated cell counters: Benefits of using validation slides over NIST standard beads

Nanobeam 4D STEM with MerlinEM - The intersection between crystallography and microscopy

TimePix 4 for imaging

Software-based segmentation of metallic inclusions of additive manufactured alloys – linking microstructure and materials properties

Streamline imaging, EDS and analysis

Connected productivity in the materials lab

Exploring the benefits of Hitachi’s SU8600 and SU8700 Field Emission SEMs

Broad ion beam milling with Hitachi’s IM4000II & ArBlade 5000

Introducing Hitachi’s SU3800SE and SU3900SE SEMs: Simplifying microscopy with easy, automatic operation

Optimizing SEM sample preparation with broad ion beam milling

Why electron microscopy is critical for battery research

The FlexSEM II: High-Resolution SEM Imaging in a surprisingly compact design

A look at tabletop SEMs

The importance of high-quality cross-sectioning for battery research

ArBlade 5000 – An innovative, high-performance sample preparation tool for SEM

The Hitachi TM4000PlusIII – Bringing high-performance SEM to the tabletop

Next generation of tabletop electron microscopes

FlexSEM: The smart little SEM that flexibly adjusts to your skills and needs

Hitachi Product Catalogue 2024/25- German

Hitachi Product Catalogue 2024/25- English

TM4000 Series Tabletop Microscopes

SE Series Scanning Electron Microscopes

Screening of copolymer nanodiscs with multi-parameter stability characterization on the Prometheus Panta

Your guide to EDS analysis in electron microscopy

Resources

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Selected Filters:

Cellular imaging insights

How to validate automated cell counters: Benefits of using validation slides over NIST standard beads

Nanobeam 4D STEM with MerlinEM - The intersection between crystallography and microscopy

TimePix 4 for imaging

Software-based segmentation of metallic inclusions of additive manufactured alloys – linking microstructure and materials properties

Streamline imaging, EDS and analysis

Connected productivity in the materials lab

Exploring the benefits of Hitachi’s SU8600 and SU8700 Field Emission SEMs

Broad ion beam milling with Hitachi’s IM4000II & ArBlade 5000

Introducing Hitachi’s SU3800SE and SU3900SE SEMs: Simplifying microscopy with easy, automatic operation

Optimizing SEM sample preparation with broad ion beam milling

Why electron microscopy is critical for battery research

The FlexSEM II: High-Resolution SEM Imaging in a surprisingly compact design

A look at tabletop SEMs

The importance of high-quality cross-sectioning for battery research

ArBlade 5000 – An innovative, high-performance sample preparation tool for SEM

The Hitachi TM4000PlusIII – Bringing high-performance SEM to the tabletop

Next generation of tabletop electron microscopes

FlexSEM: The smart little SEM that flexibly adjusts to your skills and needs

Hitachi Product Catalogue 2024/25- German

Hitachi Product Catalogue 2024/25- English

TM4000 Series Tabletop Microscopes

SE Series Scanning Electron Microscopes

Screening of copolymer nanodiscs with multi-parameter stability characterization on the Prometheus Panta

Your guide to EDS analysis in electron microscopy

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