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The importance of high-quality cross-sectioning for battery research
6 Jun 2025In this application note, Hitachi High-Tech Europe demonstrates how electron microscopy and high-quality cross sections from broad beam ion milling are invaluable in understanding and developing solutions for energy storage.
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Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Batteries